Espectrómetro de fluorescencia de rayos X por energía dispersiva (EDXRF) en-linea para la industria fotovoltáica
X-RAY 5000, 4000
FISCHER
X-ray fluorescence measuring system for continuous in-line measurement and analysis of thin coatings, i.e. CIGS, CIS, and CdTe, in production processes
Features
Flange measuring head for continuous measurements in production lines
Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
Quick and easy calibration on a workpiece master directly in the production process
For use in air or vacuum
Allows measurements even on very hot substrate materials up to 500° C (930° F)
Design is focused on maximum robustness and serviceability
Typical fields of application
Photovoltaics (CIGS, CIS, CdTe)
Analysis of thin coatings on metal strip, metal foils and plastic films
Continuous production
Process monitoring of sputter and electroplating production lines
Large-area measurement
Features
Flange measuring head for continuous measurements in production lines
Proportional counter tube, peltier-cooled silicon PIN diode or silicon drift detector as X-ray detector
Quick and easy calibration on a workpiece master directly in the production process
For use in air or vacuum
Allows measurements even on very hot substrate materials up to 500° C (930° F)
Design is focused on maximum robustness and serviceability
Typical fields of application
Photovoltaics (CIGS, CIS, CdTe)
Analysis of thin coatings on metal strip, metal foils and plastic films
Continuous production
Process monitoring of sputter and electroplating production lines
Large-area measurement
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